Energy Dispersive X-ray Fluorescence
Introduction
Energy dispersive x-ray fluorescence (EDXRF) relies on the detector and detector
electronics to resolve spectral peaks due to different energy x-rays. It
wasn't until the 1960's and early 1970's that electronics had developed
to the point that high-resolution detectors, like lithium drifted silicon,
Si(Li), 
could be made and installed in commercial devices. Computers were
also a necessity for the success of EDXRF even if they where often as large
as the instrument itself. back to top
Hardware
EDXRF is relatively simple and inexpensive compared to other techniques. It
requires and x-ray source, which in most laboratory instruments is a 50
to 60 kV 50-300 W x-ray tube. Lower cost benchtop or handheld models may
use radioisotopes such as Fe-55, Cd-109, Cm-244, Am-241 of Co-57 or a small
x-ray tube. The second major component is the detector, which must be designed
to produce electrical pulses that vary with the energy of the incident
x-rays. Most laboratory EDXRF instruments still use liquid nitrogen or
Peltier cooled Si(Li) detectors, while benchtop instruments usually have
proportional counters, or newer Peltier cooled PIN diode detectors, but
historically sodium iodide (NaI) detectors were common. Some handheld device
use other detectors such as mercuric Iodide, CdTe, and CdZnTe in addition
to PIN diode devices depending largely on the x-ray energy of the elements
of interest. The most recent and fastest growing detector technology is
the Peltier cooled silicon drift detector (SDD), which are available in
some laboratory grade EDXRF instruments.
After the source and
detector the next critical component are the x-ray tube filters,
which are available in most EDXRF instrument. There function
is to absorb transmit some energies of source x-rays more than
other in order to reduce the counts in the region of interest
while producing a peak that is well suited to exciting the elements
of interest. Secondary targets are an alternative to filters.
A secondary target material is excited by the primary x-rays
from the x-ray tube, and then emits secondary x-rays that are
characteristic of the elemental composition of the target. Where
applicable secondary targets yield lower background and better
excitation than filter but require approximate 100 times more
primary x-ray intensity. One specialized form of secondary targets
is polarizing targets. Polarizing XRF takes advantage of the
principle that when x-rays are scattered off a surface they a
partially polarized. The target and sample are place on orthogonal
axis' to further minimize the scatter and hence the background
at the detector.
Fixed or movable detector
filters, which take advantage of non-dispersive XRF principles,
are sometimes added to EDXRF devices to further improve the instruments
effective resolution or sensitivity forming a hybrid EDX/NDX
device. back to top
Applications
EDXRF can be used for a tremendous variety of elemental analysis applications.
It can be used to measure virtually every element form Na to Pu in the
periodic table, in concentrations ranging from a few ppm to nearly 100
percent. It can be used for monitoring major components in a product or
process or the addition of minor additive. Because XRF's popularity in
the geological field, EDXRF instruments are often used alongside WDXRF
instruments for measuring major and minor components in geological sample. back
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Advantages
and Disadvantages
See EDX vs WDX comparison back
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